Study of the photodecay in CdTe X-ray detectors
Identifieur interne : 000847 ( Main/Exploration ); précédent : 000846; suivant : 000848Study of the photodecay in CdTe X-ray detectors
Auteurs : P. Wurm [France] ; M. Hage-Ali [France] ; J.M. Koebel [France] ; P. Siffert [France]Source :
- Materials Science & Engineering B [ 0921-5107 ] ; 1994.
Abstract
High-resistivity cadmium telluride material and devices serving as X-ray detectors in industrial and medical equipment, such as the high-resolution tomograph, must meet specific requirements, among which sensitivity and rapidity of the photodecay are of great interest. Room temperature measurements of these parameters have been performed with a fast electronic set-up on a large variety of CdTe samples. The results show that the initial dopant is not a determining parameter for the rapidity of the decay. However, modification of the structure and the contacts of the samples can give very encouraging results.
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DOI: 10.1016/0921-5107(94)90013-2
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Room temperature measurements of these parameters have been performed with a fast electronic set-up on a large variety of CdTe samples. The results show that the initial dopant is not a determining parameter for the rapidity of the decay. However, modification of the structure and the contacts of the samples can give very encouraging results.</div></front></TEI><affiliations><list><country><li>France</li></country><region><li>Alsace (région administrative)</li><li>Grand Est</li></region><settlement><li>Strasbourg</li></settlement></list><tree><country name="France"><region name="Grand Est"><name sortKey="Wurm, P" sort="Wurm, P" uniqKey="Wurm P" first="P." last="Wurm">P. Wurm</name></region><name sortKey="Hage Ali, M" sort="Hage Ali, M" uniqKey="Hage Ali M" first="M." last="Hage-Ali">M. Hage-Ali</name><name sortKey="Koebel, J M" sort="Koebel, J M" uniqKey="Koebel J" first="J.M." last="Koebel">J.M. 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